"Abnormal Electrical Characteristics of Multi-layered MoS2 FETs Attributed to Bulk Traps"
Choong-Ki Kim+, Chan Hak Yu+, Jae Hur, Hagyoul Bae, Seung-Bae Jeon , Hamin Park , Yong Min Kim , Kyung Cheol Choi , Yang-Kyu Choi* and Sung-Yool Choi, 2D Materials, 3, 1, 2016