2016 Abnormal Electrical Characteristics of Multi-layered MoS2 FETs Attributed to Bulk Traps 본문 Author Choong-Ki Kim+, Chan Hak Yu+, Jae Hur, Hagyoul Bae, Seung-Bae Jeon , Hamin Park , Yong Min Kim , Kyung Cheol Choi , Yang-Kyu Choi* and Sung-Yool Choi Journal 2D Materials Volume/Issue 3, 1 Year 2016 Status February, Published Link https://doi.org/10.1088/2053-1583/3/1/015007 393회 연결 목록 이전글A Separate Extraction Method for Asymmetric Source and Drain Resistances Using Frequency-Dispersive C-V Characteristics in Exfoliated MoS2 FET 25.06.21 다음글Highly Transparent and Flexible Organic Light-Emitting Diodes with Structure Optimized for Anode/Cathode Multilayer Electrodes 25.06.21