2016 Suppressed instability of a-IGZO Thin Film Transistors under negative bias illumination stress using the Distributed Bragg Reflectors 본문 Author Eungtaek Kim, Woo Jae Jang, Woohyun Kim, Junhong Park, Myung Keun Lee, Sang-Hee K. Park* and Kyung Cheol Choi Journal IEEE Transactions on Electron Devices Volume/Issue 63, 3 Year 2016 Status 1066-1071, March, Published Link https://doi.org/10.1109/TED.2015.2513414 458회 연결 검색 목록 이전글Highly Reliable Hybrid Nano-stratified Moisture Barrier for Encapsulating Flexible OLEDs 25.06.21 다음글Efficient Green Organic Light-Emitting Diodes by Plasmonic Silver Nanoparticles 25.06.21